We offer the entire EDS, WDS and EBSD range from Oxford Instruments and cover all product support from sales, installation and service to training and application. We as well as our customers are convinced of the products and the experiences show stable and trustworthy results which are achieved with a user-friendly software in an uncomplicated way.

Microanalysis using an electron microscope is a widely used method for elemental determination by recording an X-ray fluorescence spectrum. The variety of Oxford Instruments EDS detectors allows us to tailor a package for your application and budget that can be attached to a Zeiss or other electron microscope. Applications range from simple point spectra acquisition to automated particle analysis. For some time now, Oxford Instruments EDS software has also enabled work within GxP guidelines.

If better resolutions than with EDS are to be achieved and quantitative analyses of small fractions are to be determined, the wavelength dispersive measurement principle with resolutions of 3-20 eV is an interesting alternative. However, the determination times are also significantly longer due to the sequential measurement method. If you also reach limits with the energy dispersive analysis method, we will help you to overcome them with a WDS.

Electron Backscattered Diffraction (EBSD) enables the investigation of crystal orientation: The backscattered electrons diffracted at the net planes of the sample strike a luminescent screen and produce a characteristic pattern of Kikuchi lines, which is detected by a CCD camera. Typical applications of this technique include texture determinations, investigation of the evolution of microstructures with temperature, or phase transformations in amorphous and nanocrystalline materials.

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