EBSD

Electron Backscattered Diffraction (EBSD) enables the investigation of crystal orientation: the backscattered electrons diffracted at the mesh planes of the sample hit a fluorescent screen and generate a characteristic pattern of Kikuchi lines, which is captured by a CCD camera. Typical applications for this technique include texture determination, investigation of the evolution of microstructures with temperature or phase transformations in amorphous and nanocrystalline materials. 

• Guaranteed indexing speeds of over 5700 pps with an EBSD pattern resolution of 156 x 128 pixels
• 1244 x 1024 pixel resolution - ideal for EBSD with high angular resolution (HR)
• Unique fibre optic coupling with sub-pixel distortion
• Extreme sensitivity enabling all types of analyses
• Software-controlled detector tilt

What can EBSD be used for? 

EBSD is an extremely versatile technique that provides a wealth of microstructural information at various scales, including phase fractions, grain structures, interfacial populations, strain distribution and crystallographic texture. This makes it a powerful characterisation tool for a wide range of research areas and industries, as shown in the table below.

More detailed information about the applications of EBSD can be found here: